分析手法

We provide two-dimensional nanoscale electrical properties measurement and imaging. Advanced electrical characterization technology and research into next generation semiconductor production equipment are our focus.

分析案例

Advanced analysis of devices including solar cells, CMOS sensor, logic/power devices and other third generation of semiconductor materials such as GaN & SiC are provided.

技术研发

Experts with decades of industry experience give the partners professional and Personalized solutions

委托指南

Our purpose is to provide professional and high-quality service. We look forward to serving you.

时事新闻

Cutting-edge information about detection and analysis technologies are available here

了解我们

Contact our team for business consulting and academic collaboration