IEEE国际可靠性物理研讨会(IRPS)于4月14日在美国德州达拉斯拉开帷幕。60年来，IRPS一直是国际上工程师和科学家在集成电路可靠性领域的盛会，吸引了来自美国、欧洲、亚洲和世界其他地区的与会者，旨在通过对应用环境的理解，提高半导体器件、集成电路和微电子组件的可靠性。
我司的CAFM信赖性测试等相关技术在IRPS峰会上均有亮相。
For 60 years, IRPS has been the premiere conference for engineers and scientists to present new and original work in the area of microelectronics reliability. Drawing participants from the United States, Europe, Asia, and all other parts of the world, IRPS seeks to understand the reliability of semiconductor devices, integrated circuits, and microelectronic systems through an improved understanding of both the physics of failure as well as the application environment.
IRPS provides numerous opportunities for attendees to increase their knowledge and understanding of all aspects of microelectronics reliability. It is also an outstanding chance to meet and network with reliability colleagues from around the world.
IRPS is Co-Sponsored by IEEE EDS and Reliability Society.
