分析手法
We provide two-dimensional nanoscale electrical properties measurement and imaging. Advanced electrical characterization technology and research into next generation semiconductor production equipment are our focus.
分析案例
Advanced analysis of devices including solar cells, CMOS sensor, logic/power devices and other third generation of semiconductor materials such as GaN & SiC are provided.
技术研发
Experts with decades of industry experience give the partners professional and Personalized solutions
分析手法
分析案例
技术研发
Please click below for more information
Section
| Base | Contact | Phone # | |
中国上海-实验室 | 张工 | zhangweinan@pronanoscan.com | +86-18621123690 |
日本东京-技术部 | 石工 | wk.junshi@gmail.com | +81-7014030788 |
Consultant
| Category | Contact | Phone # | |
SMM/SSRM/CAFM 等 | Mordun Ma | m1054462002@outlook.com | |
FIB/TEM/STEM/MA | 刘工 | liushihao@pronanoscan.com | +86-13563131012 |
